Title :
A sampled-line reflectometer for submillimeter-wave measurements
Author :
Ulker, S. ; Weikle, R.M., II
Author_Institution :
Sch. of Eng. & Appl. Sci., Virginia Univ., Charlottesville, VA, USA
Abstract :
A reflectometer designed for operation at submillimeter wavelengths and based on the sampled-transmission line architecture is described. The reflectometer is a relatively simple implementation of the six-port network analyzer introduced by Engen (IEEE Trans. Microwave Theory Tech., vol. MTT-25, no. 12, pp. 1080-1083, 1979) and consists of a section of rectangular waveguide and an ensemble of Schottky diode power detectors. Design considerations for the instrument are described and measurements in the 270 GHz to 285 GHz range are presented and discussed.
Keywords :
Schottky diodes; microwave reflectometry; network analysers; rectangular waveguides; reflectometers; signal sampling; submillimetre wave measurement; 270 to 185 GHz; Schottky diode power detectors; instrument design considerations; rectangular waveguide; reflectometer; sampled-line reflectometer; sampled-transmission line architecture; six-port network analyzer implementation; submillimeter-wave measurements; Detectors; Extraterrestrial measurements; Instruments; Millimeter wave measurements; Power transmission lines; Schottky diodes; Submillimeter wave measurements; Submillimeter wave propagation; Transmission line measurements; Wavelength measurement;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1012181
