A sampled-line reflectometer for submillimeter-wave measurements

Author

Ulker, S. ; Weikle, R.M., II

Author_Institution

Sch. of Eng. & Appl. Sci., Virginia Univ., Charlottesville, VA, USA

Volume

3

fYear

2002

fDate

2-7 June 2002

Firstpage

1677

Abstract

A reflectometer designed for operation at submillimeter wavelengths and based on the sampled-transmission line architecture is described. The reflectometer is a relatively simple implementation of the six-port network analyzer introduced by Engen (IEEE Trans. Microwave Theory Tech., vol. MTT-25, no. 12, pp. 1080-1083, 1979) and consists of a section of rectangular waveguide and an ensemble of Schottky diode power detectors. Design considerations for the instrument are described and measurements in the 270 GHz to 285 GHz range are presented and discussed.

Keywords

Schottky diodes; microwave reflectometry; network analysers; rectangular waveguides; reflectometers; signal sampling; submillimetre wave measurement; 270 to 185 GHz; Schottky diode power detectors; instrument design considerations; rectangular waveguide; reflectometer; sampled-line reflectometer; sampled-transmission line architecture; six-port network analyzer implementation; submillimeter-wave measurements; Detectors; Extraterrestrial measurements; Instruments; Millimeter wave measurements; Power transmission lines; Schottky diodes; Submillimeter wave measurements; Submillimeter wave propagation; Transmission line measurements; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2002 IEEE MTT-S International

Conference_Location

Seattle, WA, USA

ISSN

0149-645X

Print_ISBN

0-7803-7239-5

Type

conf

DOI

10.1109/MWSYM.2002.1012181

Filename

1012181