DocumentCode :
1841969
Title :
Integrated flow-thermomechanical and reliability analysis of a low air cooled flip chip-PBGA package
Author :
Hong, Bor Zen ; Yuan, Tsomg-Dih
Author_Institution :
Microelectron. Div., IBM Corp., Hopewell Junction, NY, USA
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
1354
Lastpage :
1360
Abstract :
This paper presents an integrated flow-thermomechanical and reliability analysis of a flip chip plastic ball grid array (PBGA) package under power cycling. A low air flow condition in a mixed convection environment was simulated. A cyclic chip power load of 0-3 watts with a frequency of 2 cycles per hour was applied to a 119-ball PBGA package at various air flow velocities ranging between 0.1 and 0.5 m/s. A computational fluid dynamics (CFD) model was used to determine the local heat transfer coefficients as the thermal boundary condition for finite element analysis of this power-cycled package. In reliability analysis, deformation based lifetime analysis method in conjunction with a 2-parameter Weibull statistical model was applied to estimate the thermal fatigue life and failure rate for the PBGA solder joint in the modeled package. The power-cycled PBGA has an earlier fatigue failure at the center solder joint that is contrary to the classical DNP theory. The predicted power cycling fatigue life is 1.07x to 4.87x that of temperature cycling
Keywords :
Weibull distribution; computational fluid dynamics; cooling; failure analysis; finite element analysis; flip-chip devices; integrated circuit packaging; integrated circuit reliability; plastic packaging; soldering; thermal analysis; thermal stress cracking; 0.1 to 0.5 m/s; 2-parameter Weibull statistical model; PBGA solder joint; ball grid array package; computational fluid dynamics model; deformation based lifetime analysis; failure rate; finite element analysis; flip chip PBGA package; flow-thermomechanical analysis; integrated analysis; local heat transfer coefficients; low air cooled package; plastic BGA package; power cycling; power-cycled package; reliability analysis; thermal boundary condition; thermal fatigue life; Computational fluid dynamics; Computational modeling; Deformable models; Electronics packaging; Failure analysis; Fatigue; Flip chip; Frequency; Plastic packaging; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678920
Filename :
678920
Link To Document :
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