Title :
W-Band Noise Figure Measurement Designed for On-Wafer Characterisation
Author :
Drury, Robert ; Pollard, Roger D. ; Snowden, Christopher M.
Author_Institution :
Department of Electronic & Electrical Engineering, The University of Leeds, Leeds, LS2 9JT, UK
Abstract :
The first fully automated noise and S-parameter measurement bench is reported for W-band on-wafer characterisation. A calibration procedure is described that allows the receiver reference plane to be accurately moved to the probe tip.
Keywords :
Acoustic reflection; Calibration; Electric variables measurement; Measurement techniques; Noise figure; Noise measurement; Probes; Scattering parameters; Switches; Tuners;
Conference_Titel :
ARFTG Conference Digest-Spring, 47th
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1996.327155
