• DocumentCode
    1842074
  • Title

    W-Band Noise Figure Measurement Designed for On-Wafer Characterisation

  • Author

    Drury, Robert ; Pollard, Roger D. ; Snowden, Christopher M.

  • Author_Institution
    Department of Electronic & Electrical Engineering, The University of Leeds, Leeds, LS2 9JT, UK
  • Volume
    29
  • fYear
    1996
  • fDate
    35217
  • Firstpage
    5
  • Lastpage
    8
  • Abstract
    The first fully automated noise and S-parameter measurement bench is reported for W-band on-wafer characterisation. A calibration procedure is described that allows the receiver reference plane to be accurately moved to the probe tip.
  • Keywords
    Acoustic reflection; Calibration; Electric variables measurement; Measurement techniques; Noise figure; Noise measurement; Probes; Scattering parameters; Switches; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 47th
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1996.327155
  • Filename
    4119827
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1842074