Title :
Contact impedance characterization of metallized particle column to copper strip in high frequency domains
Author :
Ben Jemaa, N. ; Himdi, M. ; Senouci, A. ; Koehler, C.
Author_Institution :
Rennes I Univ., France
Abstract :
The number of applications using high frequency bands up 10 GHz is in constant progression in various domains (high-speed communication, portable phone, radar...). This demand has been widely extended to connectors in automotive applications. In fact various connectors have been designed and developed in order to be used over a wide range of frequencies from a few MHz to several GHz. Among these connectors, metallized particle interconnects (MPI) used widely in interconnections (ASICs, PCs, workstations ...), constitute an interesting candidate to be developed for high frequency connectors, for frequencies up to 18 GHz. In order to simulate the connector, an MPI column was used as a terminal and compressed between two microstrip lines of copper (PCB). Signal losses measurements in the frequency band 100 MHz to 18 GHz are evaluated as a function of compression force. It was found that the impedance of the system is equivalent to an RCL circuit. By fitting experimental loss data we have analyzed each component and have established the impedance laws.
Keywords :
UHF measurement; copper; electric connectors; electric impedance; interconnections; loss measurement; microstrip lines; microwave measurement; 100 MHz to 18 GHz; Cu; RCL circuit; automotive applications; compression force; contact impedance characterization; copper strip; high frequency connectors; high frequency domains; impedance laws; interconnections; metallized particle column; metallized particle interconnects; microstrip lines; signal losses measurements; Connectors; Contacts; Copper; Force measurement; Frequency domain analysis; Impedance; Integrated circuit interconnections; Metallization; Radar applications; Strips;
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
DOI :
10.1109/HOLM.2004.1353108