• DocumentCode
    1842131
  • Title

    A 0.35μm SiGe BiCMOS frequency synthesizer for WCDMA mobile terminals

  • Author

    Liu, Jcn-Lung

  • Author_Institution
    SoC Technol. Center, Ind. Technol. Res. Inst., Hsinchu County, Taiwan
  • fYear
    2005
  • fDate
    27-29 April 2005
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    A highly integrated frequency synthesizer for WCDMA frequency division duplexing (FDD) mode applications is presented. It consists of three sets of synthesizers, two radio frequency (RF) synthesizers and one intermediate frequency (IF) synthesizer. All three synthesizers have been successfully integrated into one single chip and implemented in TSMC 0.35μm SiGe BiCMOS process. The RF synthesizer with external VCO covers from 2300 to 2360 MHz and has -105dBc/Hz at 100kHz offset from the carrier. In the IF synthesizer, a VCO with two external inductors and on-chip varactors in its tank, is integrated with the IF synthesizer. When locked at the IF oscillation frequency of 760 MHz, the measured phase noise of the IF synthesizer is -111 dBc/Hz at 100 kHz offset from the carrier. The maximum settling time is within 200μsec, and the reference spur is at least 76dB below the carrier power. The measured current consumption of each set of frequency synthesizers including VCO is 14mA, and measured current consumption of this chip is 42mA.
  • Keywords
    BiCMOS integrated circuits; code division multiple access; frequency division multiplexing; frequency synthesizers; radiofrequency oscillators; voltage-controlled oscillators; 0.35 micron; 100 kHz; 14 mA; 200 musec; 2300 to 2360 MHz; 42 mA; 760 MHz; FDD mode; SiGe; SiGe BiCMOS frequency synthesizer; TSMC; VCO; WCDMA mobile terminals; frequency division duplexing; inductors; intermediate frequency synthesizer; on-chip varactors; phase noise; radio frequency synthesizers; BiCMOS integrated circuits; Current measurement; Frequency measurement; Frequency synthesizers; Germanium silicon alloys; Multiaccess communication; Radio frequency; Semiconductor device measurement; Silicon germanium; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
  • Print_ISBN
    0-7803-9060-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2005.1500046
  • Filename
    1500046