DocumentCode :
1842134
Title :
Design, simulation and technological realization of a reliable packaging concept for high power laser bars
Author :
Weiss, Stefan ; Kaulfersch, Eberhard ; Töpfer, Manfred ; Aschenbrenner, Rolf ; Michel, Bernd ; Reichl, Herbert
Author_Institution :
Fraunhofer-Inst. for Reliability & Microintegration, Berlin, Germany
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
1395
Lastpage :
1401
Abstract :
We introduce a new packaging concept for high power laser bars using Au(80)Sn(20)-solder on different heatsinks e.g. CVD-diamond and CuW. First the optimal thermal concept and design with the lowest possible thermal resistance is described. The thermal simulations were done by an inhouse made computer program based on FFT (Fast-Fourier-Transformation). The results of the 3D- and 2D-FEM-simulations for the thermomechanical design show a solution with low bonding stress. Design rules based on the discussion of these results including the technological limitations are described, which were used to define different alternative packaging concepts. The technological realization of these concepts is described and presented. The electro-optical characterization of such bonded laser bars gave first indications about maximum power, thermal resistance, bonding stress and reliability
Keywords :
fast Fourier transforms; finite element analysis; heat sinks; semiconductor device packaging; semiconductor device reliability; semiconductor lasers; thermal resistance; AuSn; C; CuW; FEM-simulations; FFT; bonding stress; electro-optical characterization; heatsinks; high power laser bars; optimal thermal concept; packaging concept; reliability; thermal resistance; thermomechanical design; Bars; Bonding; Computational modeling; Computer simulation; Heat sinks; Packaging; Power lasers; Thermal resistance; Thermal stresses; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678926
Filename :
678926
Link To Document :
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