DocumentCode
1842134
Title
Design, simulation and technological realization of a reliable packaging concept for high power laser bars
Author
Weiss, Stefan ; Kaulfersch, Eberhard ; Töpfer, Manfred ; Aschenbrenner, Rolf ; Michel, Bernd ; Reichl, Herbert
Author_Institution
Fraunhofer-Inst. for Reliability & Microintegration, Berlin, Germany
fYear
1998
fDate
25-28 May 1998
Firstpage
1395
Lastpage
1401
Abstract
We introduce a new packaging concept for high power laser bars using Au(80)Sn(20)-solder on different heatsinks e.g. CVD-diamond and CuW. First the optimal thermal concept and design with the lowest possible thermal resistance is described. The thermal simulations were done by an inhouse made computer program based on FFT (Fast-Fourier-Transformation). The results of the 3D- and 2D-FEM-simulations for the thermomechanical design show a solution with low bonding stress. Design rules based on the discussion of these results including the technological limitations are described, which were used to define different alternative packaging concepts. The technological realization of these concepts is described and presented. The electro-optical characterization of such bonded laser bars gave first indications about maximum power, thermal resistance, bonding stress and reliability
Keywords
fast Fourier transforms; finite element analysis; heat sinks; semiconductor device packaging; semiconductor device reliability; semiconductor lasers; thermal resistance; AuSn; C; CuW; FEM-simulations; FFT; bonding stress; electro-optical characterization; heatsinks; high power laser bars; optimal thermal concept; packaging concept; reliability; thermal resistance; thermomechanical design; Bars; Bonding; Computational modeling; Computer simulation; Heat sinks; Packaging; Power lasers; Thermal resistance; Thermal stresses; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location
Seattle, WA
ISSN
0569-5503
Print_ISBN
0-7803-4526-6
Type
conf
DOI
10.1109/ECTC.1998.678926
Filename
678926
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