• DocumentCode
    1842134
  • Title

    Design, simulation and technological realization of a reliable packaging concept for high power laser bars

  • Author

    Weiss, Stefan ; Kaulfersch, Eberhard ; Töpfer, Manfred ; Aschenbrenner, Rolf ; Michel, Bernd ; Reichl, Herbert

  • Author_Institution
    Fraunhofer-Inst. for Reliability & Microintegration, Berlin, Germany
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    1395
  • Lastpage
    1401
  • Abstract
    We introduce a new packaging concept for high power laser bars using Au(80)Sn(20)-solder on different heatsinks e.g. CVD-diamond and CuW. First the optimal thermal concept and design with the lowest possible thermal resistance is described. The thermal simulations were done by an inhouse made computer program based on FFT (Fast-Fourier-Transformation). The results of the 3D- and 2D-FEM-simulations for the thermomechanical design show a solution with low bonding stress. Design rules based on the discussion of these results including the technological limitations are described, which were used to define different alternative packaging concepts. The technological realization of these concepts is described and presented. The electro-optical characterization of such bonded laser bars gave first indications about maximum power, thermal resistance, bonding stress and reliability
  • Keywords
    fast Fourier transforms; finite element analysis; heat sinks; semiconductor device packaging; semiconductor device reliability; semiconductor lasers; thermal resistance; AuSn; C; CuW; FEM-simulations; FFT; bonding stress; electro-optical characterization; heatsinks; high power laser bars; optimal thermal concept; packaging concept; reliability; thermal resistance; thermomechanical design; Bars; Bonding; Computational modeling; Computer simulation; Heat sinks; Packaging; Power lasers; Thermal resistance; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678926
  • Filename
    678926