Title :
Methods to eliminate dynamic errors in high-performance SAR A/D converter
Author :
Ohnhaeuser, Frank ; Huemer, Mario
Author_Institution :
High Precision Analog Texas Instrum. Dt. GmbH, Erlangen
Abstract :
The DNL performance of the last generation of Analog-to-Digital Converter (A/D Converter, ADC) based on the principle of SAR (successive-approximation register) was limited by a small amount of spikes at particular codes that changed with varying conversion rate, so that these errors were called ´dynamic errors´. These errors always appeared in pairs: a long code followed by a short code at very particular transitions. This paper is discussing the root source and techniques that fix the problem. These techniques were implemented and verified on silicon.
Keywords :
analogue-digital conversion; error correction; dynamic errors; high-performance SAR A/D converter; successive-approximation register; Analog-digital conversion; Assembly systems; Capacitors; Digital-analog conversion; Embedded system; Instruments; Resistors; Silicon; Virtual colonoscopy; Voltage;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4541938
