• DocumentCode
    1842221
  • Title

    Cost effective method for DFIG fault ride-through during symmetrical voltage dip

  • Author

    Gong, B. ; Xu, D. ; Wu, B.

  • Author_Institution
    Ryerson Univ., Toronto, ON, Canada
  • fYear
    2010
  • fDate
    7-10 Nov. 2010
  • Firstpage
    3269
  • Lastpage
    3274
  • Abstract
    This paper presents a cost-effective scheme to improve the fault ride through capability of wind turbines with doubly fed induction generators. As an alternative to using crowbar, the proposed scheme includes the stator side series-connected braking resistors, dc-link chopper and coordinated control strategy of the whole system. The proposed scheme enable the rotor converter always be connected to the system such that the DFIG will not lose controllability during fault and can almost immediately generate reactive power to support the grid after the beginning of the fault. The series-connected braking resistors can help the transient decay very fast and, at the same time, dissipate the energy of the wind turbine to reduce the rotor speed deviation during fault. Dynamic behavior of DFIG-based wind turbines during grid faults is discussed based on theoretical analysis and simulation results. It is shown that the proposed scheme can not only help the whole system ride through the fault but also reduce the stress on turbine mechanical systems.
  • Keywords
    asynchronous generators; power convertors; power generation faults; reactive power; wind turbines; DC-link chopper; DFIG fault ride-through; coordinated control strategy; cost effective method; crowbar; doubly fed induction generators; grid faults; power grid; reactive power; rotor converter; stator side series-connected braking resistors; symmetrical voltage dip; transient decay; turbine mechanical systems; wind turbine; Converters; Resistors; Rotors; Stator windings; Voltage fluctuations; Wind turbines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Glendale, AZ
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-5225-5
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2010.5675037
  • Filename
    5675037