DocumentCode :
1842281
Title :
Mitigating Soft Errors in System-on-Chip Design
Author :
Yu, Hai ; Xiaoya, Fan
Author_Institution :
TIMA Lab., Grenoble
fYear :
2008
fDate :
18-21 Nov. 2008
Firstpage :
1260
Lastpage :
1265
Abstract :
With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation scaling. Technology trends such as transistor downsizing, use of new materials and high performance computer architecture continue to increase the sensitivity of systems to soft errors. Today the technologies are moving into the period of nanotechnologies and system-on-chip (SoC) designs are widely used in most of the applications, the issues of soft errors and reliability in complex SoC designs are set to become and increasingly challenging. This paper gives a review to the soft error in SoC designs and then presents the fault tolerant solution.
Keywords :
CMOS integrated circuits; fault tolerance; integrated circuit design; integrated circuit reliability; system-on-chip; CMOS technology; fault tolerant; high performance computer architecture; nanotechnology; soft error mitigation; system-on-chip design reliability; transistor downsizing; CMOS technology; Computer errors; Costs; Electromagnetic interference; Fault tolerance; Fault tolerant systems; Integrated circuit noise; Power system reliability; Semiconductor device noise; System-on-a-chip; CMOS; Soft errors; System-on-chip; fault tolerant;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Young Computer Scientists, 2008. ICYCS 2008. The 9th International Conference for
Conference_Location :
Hunan
Print_ISBN :
978-0-7695-3398-8
Electronic_ISBN :
978-0-7695-3398-8
Type :
conf
DOI :
10.1109/ICYCS.2008.413
Filename :
4709154
Link To Document :
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