Title :
Mitigating Soft Errors in System-on-Chip Design
Author :
Yu, Hai ; Xiaoya, Fan
Author_Institution :
TIMA Lab., Grenoble
Abstract :
With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation scaling. Technology trends such as transistor downsizing, use of new materials and high performance computer architecture continue to increase the sensitivity of systems to soft errors. Today the technologies are moving into the period of nanotechnologies and system-on-chip (SoC) designs are widely used in most of the applications, the issues of soft errors and reliability in complex SoC designs are set to become and increasingly challenging. This paper gives a review to the soft error in SoC designs and then presents the fault tolerant solution.
Keywords :
CMOS integrated circuits; fault tolerance; integrated circuit design; integrated circuit reliability; system-on-chip; CMOS technology; fault tolerant; high performance computer architecture; nanotechnology; soft error mitigation; system-on-chip design reliability; transistor downsizing; CMOS technology; Computer errors; Costs; Electromagnetic interference; Fault tolerance; Fault tolerant systems; Integrated circuit noise; Power system reliability; Semiconductor device noise; System-on-a-chip; CMOS; Soft errors; System-on-chip; fault tolerant;
Conference_Titel :
Young Computer Scientists, 2008. ICYCS 2008. The 9th International Conference for
Conference_Location :
Hunan
Print_ISBN :
978-0-7695-3398-8
Electronic_ISBN :
978-0-7695-3398-8
DOI :
10.1109/ICYCS.2008.413