Title :
New Applications for Pulsed/Isothermal Test System
Author :
Scott, Jonathan ; Parker, Anthony ; Rathmell, James ; Sayed, Mohamed
Author_Institution :
Department of Electrical Engineering, The University of Sydney, Australia, 2006, jbs@ee.usyd.edu.au
Abstract :
An Arbitrary Pulsed Semiconductor Parameter Analyser (APSPA) system, developed originally for isothermal, high-power characterisation, is described. Assembled from off-the-shelf modules, the system boasts rapid and precise measurement, making it appealing for production-line use. Several novel measurements with application in research, modelling, and testing environments, are presented.
Keywords :
Current measurement; Instruments; Isothermal processes; Pulse measurements; Radio frequency; Scattering parameters; Signal resolution; System testing; Time measurement; Velocity measurement;
Conference_Titel :
ARFTG Conference Digest-Spring, 47th
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1996.327166
