Title :
Electrical conduction through small contact spots
Author_Institution :
Timron Sci. Consulting Inc., Toronto, Ont., Canada
Abstract :
Earlier literature has reported that the voltage-temperature (V-T) relation for electrical contacts, and classical electrical contact theory in general, are invalid where the a-spots are on the order of nanometers. This work reviews earlier literature dealing with the breakdown of the V-T relation and presents quantitative arguments to propose that this breakdown stems from the ballistic motion of electrons through nanometer-sized constrictions. Earlier literature also suggested that the breakdown of classical theory stems in part from thermal losses from a-spots to contaminant layers in an electrical interface. Through the use of a simple a-spot model, This work shows that this cooling mechanism is not sufficiently important to affect the validity of the classical V-T relation and classical electrical contact theory in general.
Keywords :
aluminium; contact resistance; electrical conductivity; electrical contacts; nanocontacts; tin; Al-Al; Sn-Sn; a-spot model; ballistic motion; contaminant layers; cooling mechanism; electrical conduction; electrical contact theory; electrical interface; nanocontacts; small contact spots; thermal losses; voltage-temperature relation; Contact resistance; Cooling; Electric breakdown; Electric resistance; Electrons; Nanocontacts; Resistance heating; Temperature; Thermal conductivity; Voltage;
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
DOI :
10.1109/HOLM.2004.1353116