Title :
Versatile W-band On-wafer MMIC Test Set
Author :
Lin, E.W. ; Huang, T.W. ; Lo, D.C.W. ; Wang, H. ; Yang, D.C. ; Dow, G.S. ; Allen, B.R.
Author_Institution :
TRW, Space and Electronics Group, One Space Park, M5/1041E, Redondo Beach, CA 90278
Abstract :
This paper describes the successful characterization of various W-band MMICs uniquely different in function using an automated on-wafer test set. Several thousand MMICs, including low-noise amplifiers, mixers, VCOs, and detectors, have been tested for gain, noise figure, tuning range, and responsivity, respectively. The ability of the test set to easily accommodate the individual test requirements of the different MMICs is important in establishing a high throughput system and demonstrates both its versatility and flexibility.
Keywords :
Automatic testing; Circuit testing; Detectors; Gain measurement; Low-noise amplifiers; MMICs; Noise figure; Noise measurement; Probes; Waveguide transitions;
Conference_Titel :
ARFTG Conference Digest-Spring, 47th
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1996.327169
