• DocumentCode
    1842400
  • Title

    Tunable millimeter-wave band-stop filter using electromagnetic crystal (EMXT) surfaces

  • Author

    Hao Xin ; Higgins, A. ; Kim, M.

  • Author_Institution
    Rockwell Sci. Co., Thousand Oaks, CA, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    1107
  • Abstract
    Electromagnetic crystals (EMXT), also known as photonic bandgap crystals when used in optical applications, are periodic electromagnetic structures that may consist of both dielectric and conductors. This paper presents the results of band-stop filters using the high surface impedance EMXT surfaces as the top and bottom walls of a rectangular waveguide. Fixed-tuned waveguide band-stop filters using passive EMXT surfaces with different resonant frequencies were made and demonstrated. Tunable EMXT surfaces based on InP heterostructure barrier varactors (HBV) were fabricated and used to demonstrate a proof-of-concept band-stop filter with its rejection band tuned from 31 to 36.3 GHz with a DC bias voltage from 0 to 10 V.
  • Keywords
    III-V semiconductors; band-stop filters; indium compounds; microwave filters; microwave photonics; millimetre wave filters; photonic band gap; photonic crystals; rectangular waveguides; varactors; 0 to 10 V; 31 to 36.3 GHz; DC bias voltage; EMXT; HBV; InP; InP heterostructure barrier varactors; electromagnetic crystal surfaces; fixed-tuned waveguide band-stop filters; high surface impedance EMXT surfaces; optical applications; passive EMXT surface resonant frequencies; periodic electromagnetic structures; photonic bandgap crystals; rectangular waveguide walls; rejection band; tunable EMXT surfaces; tunable millimeter-wave band-stop filter; Band pass filters; Dielectrics; Electromagnetic waveguides; Optical filters; Optical surface waves; Optical waveguides; Periodic structures; Photonic band gap; Photonic crystals; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Conference_Location
    Columbus, OH, USA
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1219429
  • Filename
    1219429