• DocumentCode
    1842484
  • Title

    Multilayer perceptron based dimensionality reduction

  • Author

    Lotlikar, Rohit ; Kothari, Ravi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1691
  • Abstract
    Dimensionality reduction is the process of mapping high dimensional patterns to a lower dimensional manifold and is typically used for visualization or as a preprocessing step in classification applications. From a classification viewpoint, the rate of increase of Bayes error serves as an ideal choice to measure the loss of information relevant to classification. Motivated by that, we present a multilayer perceptron which produces as output the lower dimensional representation. The multilayer perceptron is trained so as to minimize the classification error in the subspace. It thus differs from autoassociative like multilayer perceptrons which have been proposed and used for dimensionality reduction. We examine the performance of the proposed method of dimensionality reduction and the effect that varying the parameters have on the algorithm
  • Keywords
    Bayes methods; error statistics; learning (artificial intelligence); multilayer perceptrons; pattern classification; Bayes error; dimensional pattern; dimensionality reduction; learning; multilayer perceptron; pattern classification; Application software; Computer science; Electric variables measurement; Electronic mail; Error analysis; Laboratories; Loss measurement; Manifolds; Multilayer perceptrons; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1999. IJCNN '99. International Joint Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    1098-7576
  • Print_ISBN
    0-7803-5529-6
  • Type

    conf

  • DOI
    10.1109/IJCNN.1999.832629
  • Filename
    832629