• DocumentCode
    1842693
  • Title

    Applications of SiC MESFETs and GaN HEMTs in power amplifier design

  • Author

    Pribble, W.L. ; Palmour, J.W. ; Sheppard, S.T. ; Smith, R.P. ; Allen, S.T. ; Smith, T.J. ; Ring, Z. ; Sumakeris, J.J. ; Saxler, A.W. ; Milligan, J.W.

  • Author_Institution
    Cree Inc., Durham, NC, USA
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    1819
  • Abstract
    Very high power densities have been shown for both SiC MESFET and GaN HEMT devices. Both of these active devices benefit from the high breakdown voltages afforded by their wide-bandgap semiconductor properties. The GaN device also benefits from current densities as high as 1 A/mm. This high power density, along with good efficiency and linearity, provide an excellent base for future military and commercial power amplifier applications. High power densities are possible using narrow band power-matching networks. Although the gain-bandwidth limitation is exacerbated due to the high-impedance load lines required, high power design is possible even over multi-octave bandwidths.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MESFET integrated circuits; MMIC power amplifiers; current density; electric breakdown; gallium compounds; integrated circuit design; silicon compounds; wide band gap semiconductors; GaN; GaN HEMTs; SiC; SiC MESFETs; active devices; breakdown voltages; commercial power amplifier applications; current density; efficiency; gain-bandwidth limitation; high power design; linearity; military power amplifier applications; narrow band power-matching networks; power amplifier design; power density; wide-bandgap semiconductor properties; Broadband amplifiers; Current density; Gallium nitride; HEMTs; High power amplifiers; Linearity; MESFETs; MODFETs; Power amplifiers; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012216
  • Filename
    1012216