DocumentCode
1842693
Title
Applications of SiC MESFETs and GaN HEMTs in power amplifier design
Author
Pribble, W.L. ; Palmour, J.W. ; Sheppard, S.T. ; Smith, R.P. ; Allen, S.T. ; Smith, T.J. ; Ring, Z. ; Sumakeris, J.J. ; Saxler, A.W. ; Milligan, J.W.
Author_Institution
Cree Inc., Durham, NC, USA
Volume
3
fYear
2002
fDate
2-7 June 2002
Firstpage
1819
Abstract
Very high power densities have been shown for both SiC MESFET and GaN HEMT devices. Both of these active devices benefit from the high breakdown voltages afforded by their wide-bandgap semiconductor properties. The GaN device also benefits from current densities as high as 1 A/mm. This high power density, along with good efficiency and linearity, provide an excellent base for future military and commercial power amplifier applications. High power densities are possible using narrow band power-matching networks. Although the gain-bandwidth limitation is exacerbated due to the high-impedance load lines required, high power design is possible even over multi-octave bandwidths.
Keywords
HEMT integrated circuits; III-V semiconductors; MESFET integrated circuits; MMIC power amplifiers; current density; electric breakdown; gallium compounds; integrated circuit design; silicon compounds; wide band gap semiconductors; GaN; GaN HEMTs; SiC; SiC MESFETs; active devices; breakdown voltages; commercial power amplifier applications; current density; efficiency; gain-bandwidth limitation; high power design; linearity; military power amplifier applications; narrow band power-matching networks; power amplifier design; power density; wide-bandgap semiconductor properties; Broadband amplifiers; Current density; Gallium nitride; HEMTs; High power amplifiers; Linearity; MESFETs; MODFETs; Power amplifiers; Silicon carbide;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location
Seattle, WA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7239-5
Type
conf
DOI
10.1109/MWSYM.2002.1012216
Filename
1012216
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