Title :
Experimental and analytical models of the connector insertion-extraction phase
Author :
El Manfalouti, A. ; Benjemaa, N. ; El Abdi, R.
Author_Institution :
Rennes I Univ., France
Abstract :
Studies of connectors for electric and electronic automotive systems have been and still are being pursued. The main criterion for the electrical contact reliability is to minimize the connector insertion force, which mainly depends on the contact force determined by the mechanical design. A non-intrusive technique for contact force determination by deflection measurement of the contact spring during insertion and extraction phase using a laser device has been developed. We have access to the following insertion parameters during the insertion stroke: contact deflection δ which yields the contact force Fc, insertion force Fi and contact resistance Rc. Regarding the results for real connectors, an experimental model of a connector based on a cylindrical pin crossed with a cylindrical spring, is proposed in This work. With this simple setup, we have made an analytical model, which permits analysis of the influence of each parameter (width, spring radius etc). Based on analysis of the influence of the spring width and of the gap, this study offers the possibility of optimizing the design of such connectors for use in the automotive industry.
Keywords :
automobile industry; automotive components; automotive electronics; contact resistance; electric connectors; electrical contacts; automotive industry; connector design; connector extraction phase; connector insertion force; contact deflection; contact force determination; contact resistance; contact spring; cylindrical pin; cylindrical spring; deflection measurement; electric automotive systems; electrical contact reliability; electronic automotive systems; laser device; mechanical design; nonintrusive technique; Analytical models; Automotive engineering; Connectors; Contact resistance; Electrical resistance measurement; Force measurement; Laser modes; Phase measurement; Springs; Testing;
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
DOI :
10.1109/HOLM.2004.1353136