• DocumentCode
    1842798
  • Title

    Dual-block-pipelined VLSI architecture of entropy coding for H.264/AVC baseline profile

  • Author

    Chen, Tung-Chien ; Huang, Yu-Wen ; Tsai, Chuan-Yong ; Hsieh, Bing-Yu ; Chen, Liang-Gee

  • Author_Institution
    Dept. of Electr. Eng., National Taiwan Univ., Taipei, Taiwan
  • fYear
    2005
  • fDate
    27-29 April 2005
  • Firstpage
    271
  • Lastpage
    274
  • Abstract
    Direct VLSI implementation of context-based adaptive variable length coding (CAVLC) for residues, as a modification from conventional run-length coding, will lead to low throughput and utilization. In this paper, an efficient CAVLC design is proposed. The main concept is the two-stage block pipelining scheme for parallel processing of two 4×4-blocks. When one block is processed by the scanning engine to collect the required symbols, its previous block is handled by the coding engine to translate symbols into bitstream. The dual-block-pipelined architecture doubles the throughput and utilization of CAVLC at high bitrates. Moreover, a zero skipping technique is adopted to reduce up to 90% of cycles at low bitrates. Last but not least, exponential-Golomb coding for other general symbols and bitstream encapsulation for network abstraction layer are integrated with CAVLC engine as a complete entropy coder for H.264/AVC baseline profile. Simulation results show that our design is capable of real-time processing for 1920 × 1088 30fps videos with 23.6K logic gates at 100MHz.
  • Keywords
    VLSI; digital signal processing chips; encoding; hardware-software codesign; instruction sets; logic circuits; variable length codes; video coding; 100 MHz; CAVLC; H.264/AVC; VLSI; baseline profile; context based adaptive variable length coding; dual block pipelined architecture; entropy coding; exponential Golomb coding; parallel processing; Automatic voltage control; Bit rate; Encapsulation; Engines; Entropy coding; Parallel processing; Pipeline processing; Throughput; Very large scale integration; Videos;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
  • Print_ISBN
    0-7803-9060-1
  • Type

    conf

  • DOI
    10.1109/VDAT.2005.1500073
  • Filename
    1500073