Title :
ISOS: Space Overlapping Based on Iteration Access Patterns for Dynamic Scratch-pad Memory Management in Embedded Systems
Author :
Yang, Yanqin ; Shao, Zili ; Pan, Linfeng ; Guo, Minyi
Author_Institution :
Dept. of Comput. Sci. & Eng., Shanghai Jiao-Tong Univ., Shanghai
Abstract :
Scratch-pad memory (SPM), a small fast software-managed on-chip SRAM (static random access memory), is widely used in embedded systems. With the ever-widening performance gap between processors and main memory, it is very important to reduce the serious off-chip memory access overheads caused by transferring data between SPM and off-chip memory. In this paper, we propose a novel compiler-assisted iteration-access-pattern-based space overlapping technique for dynamic SPM management (ISOS) with DMA (direct memory access). In ISOS, we combine both SPM and DMA for performance optimization by exploiting the chance to overlap SPM space so as to further utilize the limited SPM space and reduce the number of DMA operations. We implement our technique based on IMPACT and conduct experiments using a set of benchmarks form DSPstone and Mediabench on the cycle-accurate VLIW simulator of Trimaran. The experimental results show that our technique achieves significant run-time performance improvement compared with the previous work.
Keywords :
SRAM chips; embedded systems; program compilers; storage management; DMA operation; Trimaran cycle-accurate VLIW simulator; compiler-assisted iteration-access-pattern-based space overlapping technique; direct memory access; dynamic scratch-pad memory management; embedded system; off-chip memory access overhead; on-chip SRAM; performance optimization; static random access memory; Embedded system; ISO; Memory management; Optimization; Random access memory; Runtime; SRAM chips; Scanning probe microscopy; System-on-a-chip; VLIW; DMA; Scratch-pad memory; space overlapping;
Conference_Titel :
Young Computer Scientists, 2008. ICYCS 2008. The 9th International Conference for
Conference_Location :
Hunan
Print_ISBN :
978-0-7695-3398-8
Electronic_ISBN :
978-0-7695-3398-8
DOI :
10.1109/ICYCS.2008.538