Title :
Contact material and arc current affect on post-current zero contact surface temperature
Author :
Shea, John J. ; Zhou, Xin
Author_Institution :
Eaton Electr., Eaton Corp., Pittsburgh, PA, USA
Abstract :
Optical radiation measurements of contact surfaces were made after current-zero of a high-current (>10 kAp) arc, to determine how much the contact surface temperature at and after current zero was affected by a change in contact material and arc current. Contact surface temperature was measured for different types of "typical" contact materials (AgW and AgC) commonly used in molded case circuit breakers (MCCB\´s). The average temperature at the contact surface was measured by using photodiodes in conjunction with a narrow band filters and a long-range microscope. A 250 Amp rated MCCB was modified, with renewable chamber walls and contacts, and used as a test bed to insure that these results can be directly applied to MCCB\´s in the 125 to 250 Amp range. Uniform and repeatable arcing conditions were maintained by using an electronically timed capacitor bank source, timed contact part, and a well-maintained arc chamber. Along with other important engineering properties of the contacts (arc erosion, temperature rise), this data can be useful for selecting contacts for circuit breaker applications.
Keywords :
circuit breakers; circuit-breaking arcs; photodiodes; 125 to 250 A; AgW-AgC; arc chamber; arc current; arc erosion; arcing conditions; contact material; current zero contact surface temperature; electronic timed capacitor bank source; engineering properties; molded case circuit breakers; narrow band filters; optical microscopy; optical radiation measurements; photodiodes; renewable chamber walls; test bed; Capacitors; Circuit breakers; Circuit testing; Current measurement; Microscopy; Narrowband; Optical filters; Optical materials; Photodiodes; Temperature measurement;
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
DOI :
10.1109/HOLM.2004.1353137