DocumentCode :
1842837
Title :
Demonstration of a semiconductor external cavity laser utilising a UV written grating in a planar silica waveguide
Author :
Maxwell, Graeme D. ; Kashyap, Raman ; Sherlock, G. ; Collins, John V. ; Ainslie, B.James
Author_Institution :
British Telecom Res. Labs., Ipswich, UK
fYear :
1994
fDate :
34631
Firstpage :
42583
Lastpage :
42589
Abstract :
We have demonstrated for the first time the use of a UV written grating in a photosensitive planar silica waveguide as a feedback element in an external cavity semiconductor waveguide laser. This device was tested in a 2.5 GBit/s system over 100 km of standard fibre and was shown to suffer negligible receiver sensitivity loss, (0.35 dB) for a 10 -9 BER as compared with a back-to-back measurement
Keywords :
diffraction gratings; 0.35 dB; 100 km; 2.5 GBit/s system; 2.5 Gbit/s; UV written grating; back-to-back measurement; external cavity semiconductor waveguide laser; feedback element; negligible receiver sensitivity loss; photosensitive planar silica waveguide; planar silica waveguide; semiconductor external cavity laser;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Planar Silicon Hybrid Optoelectronics (Digest No. 1994/198), IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
678965
Link To Document :
بازگشت