DocumentCode
1842837
Title
Demonstration of a semiconductor external cavity laser utilising a UV written grating in a planar silica waveguide
Author
Maxwell, Graeme D. ; Kashyap, Raman ; Sherlock, G. ; Collins, John V. ; Ainslie, B.James
Author_Institution
British Telecom Res. Labs., Ipswich, UK
fYear
1994
fDate
34631
Firstpage
42583
Lastpage
42589
Abstract
We have demonstrated for the first time the use of a UV written grating in a photosensitive planar silica waveguide as a feedback element in an external cavity semiconductor waveguide laser. This device was tested in a 2.5 GBit/s system over 100 km of standard fibre and was shown to suffer negligible receiver sensitivity loss, (0.35 dB) for a 10 -9 BER as compared with a back-to-back measurement
Keywords
diffraction gratings; 0.35 dB; 100 km; 2.5 GBit/s system; 2.5 Gbit/s; UV written grating; back-to-back measurement; external cavity semiconductor waveguide laser; feedback element; negligible receiver sensitivity loss; photosensitive planar silica waveguide; planar silica waveguide; semiconductor external cavity laser;
fLanguage
English
Publisher
iet
Conference_Titel
Planar Silicon Hybrid Optoelectronics (Digest No. 1994/198), IEE Colloquium on
Conference_Location
London
Type
conf
Filename
678965
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