Title :
Simulations of noise-parameter uncertainties
Author_Institution :
RF Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
This paper reports results for uncertainties obtained from a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying quantities. Results have been obtained for the effect due to uncertainties in the reflection coefficients of the input terminations, the noise temperature of the hot noise source, connector variability, the ambient temperature, and the measurement of the output noise. Representative results are presented for both uncorrelated and correlated uncertainties in the underlying quantities.
Keywords :
Monte Carlo methods; electric noise measurement; measurement uncertainty; Monte Carlo simulation; ambient temperature; connector variability; hot noise source; input termination; measurement uncertainty; noise parameters; noise temperature; output noise; reflection coefficient; Acoustic reflection; Computational modeling; Equations; Measurement uncertainty; NIST; Noise measurement; Power measurement; Protection; Radiometry; Temperature measurement;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1012222
