Title :
Envelope Distortion Models with Memory Improve the Prediction of Spectral Regrowth for Some RF Amplifiers
Author :
Heutmaker, Michael S. ; Wu, Eleanor ; Welch, John R.
Author_Institution :
Lucent Technologies Bell Laboratories, P.O. Box 900, Princeton, NJ 08542
Abstract :
The gain compression (am-am), phase distortion (am-pm), and spectral regrowth of an RF amplifier may be found from measurements of the complex modulation envelope. The relationship between the distortion and spectral regrowth is explored by modeling the am-am and am-pm, and then simulating spectral regrowth from the distortion model. Comparison of measurement and model results shows that when hysteresis is present in the amplifier am-am and am-pm distortion, a model with memory is needed to predict the spectral regrowth accurately (within 1 dB).
Keywords :
Binary phase shift keying; Bit rate; Distortion measurement; Frequency; Hysteresis; Power amplifiers; Power measurement; Power system modeling; Predictive models; Radiofrequency amplifiers;
Conference_Titel :
ARFTG Conference Digest-Fall, 48th
Conference_Location :
Clearwater, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1996.327183
