• DocumentCode
    1842958
  • Title

    On the evaluation of low level contact erosion

  • Author

    McBride, J.W. ; Sumption, A.P. ; Swingler, J.

  • Author_Institution
    Sch. of Eng. Sci., Southampton Univ., UK
  • fYear
    2004
  • fDate
    20-23 Sept. 2004
  • Firstpage
    370
  • Lastpage
    377
  • Abstract
    The use of non contact laser measurement systems has introduced the ability to enable the precise measurement of volume change in relay contacts without the requirement of dismantling the main device. Following a previous study of volumetric erosion in DC automotive relays, an area of further investigation was highlighted. The further investigation deals with conditions leading to particularly low levels of erosion such as low current levels (5 A) and low operation lifetime (50-50000 cycles). The objective of the current study is to utilise recent improvements in resolution and measurement software of the system to perform a closer analysis of low level erosion contacts and determine the minimum level of erosion that can be detected. The study shows that current level is the defining factor influencing low level erosion samples. As the current level increases there is an enlarged erosion diameter. The study looks at the erosion processes and shows that current level has greater influence over contact erosion than the number of operation cycles.
  • Keywords
    automotive electronics; contactors; electrical contacts; indium compounds; measurement by laser beam; relays; silver compounds; tin compounds; 5 A; AgSnInO; DC automotive relays; contact erosion; measurement software; noncontact laser measurement systems; relay contact life time; volumetric erosion; Automotive engineering; Current measurement; Laser transitions; Performance analysis; Performance evaluation; Relays; Software measurement; Software performance; Software systems; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
  • Print_ISBN
    0-7803-8460-1
  • Type

    conf

  • DOI
    10.1109/HOLM.2004.1353143
  • Filename
    1353143