Title :
MIMCAP dynamic leakage impact to switched-capacitor sigma-delta converters in deep-submicron digital CMOS processes
Author :
Zhang, Wcibiao ; Hu, Yin ; Shichijo, Hisashi
Author_Institution :
Texas Instruments, Inc., Dallas, TX, USA
Abstract :
This paper describes the performance of sigma-delta analog-to-digital converters in a 130nm CMOS digital process and the impact of the dynamic leakage of metal-insulalor-metal capacitor (MIMCAP). A second-order sigma-delta analog-to-digital converter (ADC) for voice applications is built in a 130nm digital CMOS process. The leakage effect from the MTMCAP is investigated and correlated with idle-channel noise (ICN) performance. Dithering is applied to reduce the idle-channel tones and improve the linearity of the ADC.
Keywords :
CMOS digital integrated circuits; MIM devices; capacitors; leakage currents; sigma-delta modulation; switched capacitor networks; 130 nm; MIMCAP; digital CMOS processes; dynamic leakage impact; idle channel noise; sigma-delta converters; switched capacitor; Analog-digital conversion; CMOS process; Delta-sigma modulation; Frequency; Parasitic capacitance; Signal to noise ratio; Switched capacitor circuits; Switching circuits; Switching converters; Voltage;
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN :
0-7803-9060-1
DOI :
10.1109/VDAT.2005.1500082
