Title :
Fault diagnosis and PD-PWM reconfiguration of a 5-level double-boost PFC with fault-tolerant capability
Author :
Pham, Thi Thuy Linh ; Richardeau, Frédéric ; Gateau, Guillaume
Author_Institution :
LAPLACE (Lab. Plasma et Conversion d´´Energie), Univ. de Toulouse, Toulouse, France
Abstract :
A 5-level PFC topology with fault-diagnostic and fault-tolerant capability is proposed and compared to known structures. It is derived from a 3-level non differential double-boost PFC including fly-cap cells. The series-connection of the two low-voltage switching-cells is decoupled by a single flying capacitor that provides a direct fault-tolerant capability and a post-failure operation increasing the availability of converter. The monitoring of the voltages across flying capacitors allows a rapid detection and localization either for open circuit failure or short-circuit failure. A phase-disposition PWM reconfiguration is also used and presented in order to optimize both normal operation and post-fault continuation. The design and the most important features are highlighted thanks to a digital control frame and a mock-up rated to AC115V-DC400V-4kW-2×31kHz.
Keywords :
PWM power convertors; digital control; fault diagnosis; fault tolerance; power capacitors; power factor correction; switching convertors; 3-level nondifferential double-boost PFC; 5-level PFC topology; 5-level double-boost PFC; PD-PWM reconfiguration; converter; digital control; fault diagnosis; fault-tolerant capability; fly-cap cell; flying capacitor; low-voltage switching-cell; open circuit failure; phase-disposition PWM reconfiguration; power factor correction; short-circuit failure; Circuit faults; Pulse width modulation; Switching frequency; Topology; Transistors; Voltage control; Diagnosis; Fault Tolerant Capability; Multilevel Converter; Power Factor Correction (PFC);
Conference_Titel :
IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
Conference_Location :
Glendale, AZ
Print_ISBN :
978-1-4244-5225-5
Electronic_ISBN :
1553-572X
DOI :
10.1109/IECON.2010.5675074