Title :
On improving dynamic range of wideband multistage ΣΔ modulator using nonlinear oscillation
Author :
Chang, Teng-Hung ; Dung, Lan-Rong ; Guo, Jwin-Yen
Author_Institution :
Dept. of Electr. & Control Eng., National Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
This paper presents an improved architecture of the multistage (MASH) multibit sigma-delta modulators (ΣΔMs). The architecture can be immune to circuit nonidealities over a large portion of input range when oversampling ratio (OSR) is low, and hence the dynamic range (DR) can be improved. The approach presented is based on two resonator topologies, high-Q cascade-of-resonator-with-feedforward (HQCRFF) and low-Q cascade-of-integrator-with-feed forward (LQCIFF). The key to improving DR is to use HQCRFF-based single-bit structure in the first stage and have the first stage oscillated. When the first stage oscillates, the coarse quantization noise vanishes and hence circuit nonidealities, such as finite op-amp gain and capacitor mismatching, do not cause leakage quantization noise problem. In addition, because of the in-band zeros introduced by the resonators, the proposed architecture enhances the suppression of the in-band quantization noise for wideband applications. As the results of simulation, the proposed MASH architecture can inherently have wide DR without using additional calibration techniques.
Keywords :
circuit simulation; interference suppression; modulators; resonators; sigma-delta modulation; signal sampling; HQCRFF; LQCIFF; MASH; dynamic range improvement; high-Q cascade-of-resonator-with-feedforward; in-band quantization noise; low-Q cascade-of-integrator-with-feed forward; nonlinear oscillation; oversampling ratio; wideband multistage ΣΔ modulator; Capacitors; Circuit noise; Circuit simulation; Circuit topology; Delta-sigma modulation; Dynamic range; Multi-stage noise shaping; Operational amplifiers; Quantization; Wideband;
Conference_Titel :
VLSI Design, Automation and Test, 2005. (VLSI-TSA-DAT). 2005 IEEE VLSI-TSA International Symposium on
Print_ISBN :
0-7803-9060-1
DOI :
10.1109/VDAT.2005.1500085