DocumentCode
1843193
Title
Advanced image characterization in scanning probe microscopy
Author
Rodrigues, C.A. ; Pitto, S.C.D. ; Costa, L.D.F. ; Faria, R.M. ; de Souza, N.C. ; Oliveira, O.N. ; Bechtold, I.H. ; Oliveira, E.A. ; Bonvent, J.J.
Author_Institution
IFSC, Sao Paulo Univ., Brazil
fYear
2001
fDate
37165
Firstpage
393
Abstract
This work presents the application of advanced analysis processes and data mining to images produced by scanning probe microscopy in polymer samples. These techniques are applied to two specific problems: statistical characterization of polydispersivity in films of poly (o-methoxyaniline) (POMA) and morphological analysis of substrates of polymers used to produce liquid crystal alignment
Keywords
data mining; image processing; physics computing; polymers; scanning probe microscopy; POMA; advanced image characterization; analysis processes; data mining; liquid crystal alignment; morphological analysis; poly (o-methoxyaniline); polydispersivity; polymer samples; polymer substrates; scanning probe microscopy; statistical characterization; Application software; Image analysis; Image texture analysis; Liquid crystal devices; Liquid crystal polymers; Liquid crystals; Optical films; Polymer films; Scanning probe microscopy; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Graphics and Image Processing, 2001 Proceedings of XIV Brazilian Symposium on
Conference_Location
Florianopolis
Print_ISBN
0-7695-1330-1
Type
conf
DOI
10.1109/SIBGRAPI.2001.963099
Filename
963099
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