Title :
Advanced image characterization in scanning probe microscopy
Author :
Rodrigues, C.A. ; Pitto, S.C.D. ; Costa, L.D.F. ; Faria, R.M. ; de Souza, N.C. ; Oliveira, O.N. ; Bechtold, I.H. ; Oliveira, E.A. ; Bonvent, J.J.
Author_Institution :
IFSC, Sao Paulo Univ., Brazil
Abstract :
This work presents the application of advanced analysis processes and data mining to images produced by scanning probe microscopy in polymer samples. These techniques are applied to two specific problems: statistical characterization of polydispersivity in films of poly (o-methoxyaniline) (POMA) and morphological analysis of substrates of polymers used to produce liquid crystal alignment
Keywords :
data mining; image processing; physics computing; polymers; scanning probe microscopy; POMA; advanced image characterization; analysis processes; data mining; liquid crystal alignment; morphological analysis; poly (o-methoxyaniline); polydispersivity; polymer samples; polymer substrates; scanning probe microscopy; statistical characterization; Application software; Image analysis; Image texture analysis; Liquid crystal devices; Liquid crystal polymers; Liquid crystals; Optical films; Polymer films; Scanning probe microscopy; Surface morphology;
Conference_Titel :
Computer Graphics and Image Processing, 2001 Proceedings of XIV Brazilian Symposium on
Conference_Location :
Florianopolis
Print_ISBN :
0-7695-1330-1
DOI :
10.1109/SIBGRAPI.2001.963099
