DocumentCode :
1843480
Title :
Thermally induced mechanical degradation of contact spots in aluminum interfaces
Author :
Ruppert, Christopher ; Runde, Magne
Author_Institution :
Dept. of Electr. & Semicond., European Patent Office, Den Haag, Netherlands
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
494
Lastpage :
501
Abstract :
Deterioration of an electric contact is closely related to phenomena occurring in the microscopic contact spots in the contact interface. Contact spots in idealized aluminum/aluminum contact interfaces, that have passed heavy alternating currents, have been carefully examined by scanning electron microscopy and metallographic imaging techniques. Small cracks are observed in the contact spot regions, and have to a great extent impaired the current-carrying ability of the area. The temperature in the contact spots cycles with twice the power frequency, and in heavily stressed contacts the maximum temperature reaches several hundred degrees centigrade. The associated local thermal expansion and contraction in and around the immediate vicinity of the contact spot generates cyclic mechanical forces of substantial magnitudes. Indications that this repetitive stress causes the observed cracks are found. It is suggested that the resistance increase observed in practical aluminum connectors being subjected to short-circuit currents can have a similar origin.
Keywords :
aluminium; contact resistance; electric connectors; electrical contacts; metallography; scanning electron microscopy; short-circuit currents; thermal expansion; thermal stress cracking; Al-Al; aluminium-aluminium contact interface; aluminum connectors; contact spots cycles; cracks; cyclic mechanical forces; electric contact; metallographic imaging techniques; microscopic contact spots; scanning electron microscopy; short-circuit currents; thermal contraction; thermal expansion; thermally induced mechanical degradation; Aluminum; Connectors; Contacts; Frequency; Scanning electron microscopy; Temperature; Thermal degradation; Thermal expansion; Thermal force; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts
Print_ISBN :
0-7803-8460-1
Type :
conf
DOI :
10.1109/HOLM.2004.1353162
Filename :
1353162
Link To Document :
بازگشت