DocumentCode :
1843662
Title :
Design and analysis of skewed-distribution scan chain partition for improved test data compression
Author :
Wang, Sying Jyan ; Chen, Shih Cheng ; Li, Katherine Shu Min
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Chung-Hsing Univ., Taichung
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
2641
Lastpage :
2644
Abstract :
Code-based test data compression schemes encode symbols in the test data with predetermined codewords so that data volume can be reduced. The compression efficiency is affected by the distribution of data symbols. In this paper, we first analyze the factors that affect the encoding efficiency in various codes, and then propose a skewed-distribution scan chain partitioning scheme, in which the distribution of 0´s and 1´s are changed in different parts of the scan chain. Both analytical and experimental results confirm that the scheme can effectively improve compression efficiency, while the routing penalty due to the partitioning method is limited.
Keywords :
boundary scan testing; data compression; logic testing; code based test data compression schemes; compression efficiency; data symbols distribution; predetermined codewords; skewed distribution scan chain partition; Automatic testing; Circuit testing; Computer science; Data engineering; Decoding; Dictionaries; Frequency; Registers; Routing; Test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4541999
Filename :
4541999
Link To Document :
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