DocumentCode
1843662
Title
Design and analysis of skewed-distribution scan chain partition for improved test data compression
Author
Wang, Sying Jyan ; Chen, Shih Cheng ; Li, Katherine Shu Min
Author_Institution
Dept. of Comput. Sci. & Eng., Nat. Chung-Hsing Univ., Taichung
fYear
2008
fDate
18-21 May 2008
Firstpage
2641
Lastpage
2644
Abstract
Code-based test data compression schemes encode symbols in the test data with predetermined codewords so that data volume can be reduced. The compression efficiency is affected by the distribution of data symbols. In this paper, we first analyze the factors that affect the encoding efficiency in various codes, and then propose a skewed-distribution scan chain partitioning scheme, in which the distribution of 0´s and 1´s are changed in different parts of the scan chain. Both analytical and experimental results confirm that the scheme can effectively improve compression efficiency, while the routing penalty due to the partitioning method is limited.
Keywords
boundary scan testing; data compression; logic testing; code based test data compression schemes; compression efficiency; data symbols distribution; predetermined codewords; skewed distribution scan chain partition; Automatic testing; Circuit testing; Computer science; Data engineering; Decoding; Dictionaries; Frequency; Registers; Routing; Test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4541999
Filename
4541999
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