Title :
Resonant tunneling of microwave energy in thin film multilayer metal/dielectric structures
Author :
Eriksson, A. ; Deleniv, A. ; Gevorgian, S.
Author_Institution :
Dept. of Microelectron., Chalmers Univ. of Technol., Gothenburg, Sweden
Abstract :
Multilayer metal/dielectric structures, typically consisting of sub-micrometer thickness dielectric and metal layers (two or more), are highly transparent at microwave frequencies, if properly designed. The high transparency is due to the resonant tunneling of microwave power through metal layers, provided that they are thinner than the skin depth, and the metal/dielectric layers are designed (dielectric constant, thickness, conductivity, lateral dimension) to provide a coherent phase distribution. A method, combining axial and radial resonance conditions, is used to optimize the multilayer electrodes in a circular parallel-plate disk resonator and achieve substantial quality factor enhancement in comparison with thick metal electrodes.
Keywords :
Q-factor; microwave materials; multilayers; resonant tunnelling; resonators; skin effect; axial resonance conditions; circular parallel-plate disk resonator; coherent phase distribution; conductivity; dielectric constant; high microwave transparency; lateral dimension; microwave energy; microwave losses; multilayer electrodes optimization; multilayer metal/dielectric structures; quality factor enhancement; radial resonance conditions; resonant tunneling; skin depth; sub-micrometer metal layers; sub-micrometer thickness dielectric layers; surface impedance; Conductivity; Dielectric constant; Dielectric thin films; Electrodes; Microwave frequencies; Nonhomogeneous media; Resonance; Resonant tunneling devices; Skin; Transistors;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1012261