Title :
FEM-based reduced-order model for steady-state skin-effect analysis in lossy lines
Author :
Bertazzi, F. ; Carbonera, F. ; Goano, M. ; Ghione, G.
Author_Institution :
Dipt. di Elettronica, Politecnico di Torino, Italy
Abstract :
A quasi-static finite element technique is proposed for the accurate and efficient computation of the frequency-dependent characteristic parameters or lossy transmission lines having electrodes of arbitrary cross-section on multi-layered, planar or non-planar substrates. A novel formulation of the magneto-quasi-static problem is combined with a robust fast frequency-sweep technique based on the numerical generation of problem-matched basis functions. The proposed technique enables to accurately model the frequency-dependent penetration of electromagnetic fields inside lossy conductors with a reduced set of problem-specific functions. Extensive comparisons are provided between state-of-the-art full-wave finite element method and the present technique: excellent agreement is demonstrated with the full-wave solution, at a fraction of its computational cost.
Keywords :
coplanar waveguides; eddy currents; finite element analysis; high-frequency transmission lines; reduced order systems; singular value decomposition; skin effect; transmission line theory; FEM-based reduced-order model; arbitrary cross-section electrodes; cylindrical wire; eddy currents; electromagnetic field penetration; fast frequency-sweep technique; frequency-dependent characteristic parameters; lossy conductors; lossy transmission lines; magneto-quasi-static problem; multi-layered substrates; numerical generation; problem-matched basis functions; quasi-static finite element technique; ridge-type coplanar waveguide; singular value decomposition; steady-state skin-effect analysis; Electrodes; Electromagnetic modeling; Finite element methods; Frequency; Magnetic analysis; Planar transmission lines; Propagation losses; Reduced order systems; Robustness; Steady-state;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1012265