Title :
60 GHz On-Wafer Noise Parameter Measurements Using Cold-Source Method
Author :
Lahdes, Manu ; Sipilä, Markku ; Tuovinen, Jussi
Author_Institution :
MilliLab, VTT Information technology, P.O. Box 1202, FIN-02044 VTT, Finland, tel: +358 9 4565923 fax: +358 9 4567013, e-mail: manu.lahdes@vtt.fi
Abstract :
Noise parameter measurement set-up for 60 GHz is described. The designed and built set-up is based on the cold-source method. Both S- and noise parameters are measured with the set-up. Measurement results of the an InP HEMT noise parameters at 58-62 GHz are shown, as well as accuracy of the results is discussed.
Keywords :
Acoustic reflection; Admittance; Electrical resistance measurement; Frequency measurement; Impedance; Noise figure; Noise measurement; Scattering parameters; Switches; Tuners;
Conference_Titel :
ARFTG Conference Digest-Spring, 49th
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327223
