Title :
High linear voltage references for on-chip CMOS smart temperature sensor from −60°C to 140°C
Author :
Tsai, Joseph Tso-sheng ; Chiueh, Herming
Author_Institution :
Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu
Abstract :
A low-cost and high linear voltage reference circuitry is designed and implemented in TSMC 0.18 mum CMOS technology. Previous research has proposed the use of MOS transistors operated in the weak inversion region to replace the bipolar devices with conventional PTAT (proportional to absolute temperature) circuits. However, such solutions often cause linearity problem in high temperature region because of the current leaking devices in modern deep sub micron and nano-scale CMOS technology. The proposed circuit utilized temperature complementation technique on two voltage references, PTAT and IOAT (independent of absolute temperature) references, to enhance the linearity and produce a stable IOAT voltage reference. Based on the measurement results, the R-square of PTAT reference is better than 0.9 and the temperature coefficient of IOAT reference is 14 ppm/degC in a considerable wider temperature range from -60degC to 140degC. The occupied chip area is 0.00126 mm . Thus, a fully integrated temperature sensor with wider temperature range is designed and easily to integrate to modern system-on-chip designs with minimal efforts.
Keywords :
CMOS integrated circuits; integrated circuit design; intelligent sensors; system-on-chip; temperature sensors; MOS transistors; PTAT; bipolar devices; current leaking devices; high linear voltage references; independent of absolute temperature; integrated temperature sensor; on-chip CMOS smart temperature sensor; proportional to absolute temperature; size 0.18 mum; system-on-chip designs; temperature -60 degC to 140 degC; weak inversion region; CMOS technology; Integrated circuit measurements; Linearity; MOSFETs; Nanoscale devices; Semiconductor device measurement; System-on-a-chip; Temperature distribution; Temperature sensors; Voltage;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4542011