DocumentCode
1844066
Title
Integrated modeling of nonlinear dynamics and contact mechanics of electrostatically actuated RF-MEMS switches
Author
Do, Cuong ; Cychowski, Marcin ; Lishchynska, Maryna ; Hill, Martin ; Delaney, Kieran
Author_Institution
NIMBUS Centre, Cork Inst. of Technol., Cork, Ireland
fYear
2010
fDate
7-10 Nov. 2010
Firstpage
2293
Lastpage
2298
Abstract
In this work, a novel nonlinear dynamic model is developed to investigate the bouncing and deformation behaviors of an electrostatically actuated, ohmic-contact RF-MEMS switch. The model accounts for a real geometry, the electrostatic actuation, squeeze-film damping effect, and the nonlinear elastic-plastic contact mechanics using Hertz theory. A low-complexity formulation based on finite differential analysis is employed to solve the model equations in the time-domain. The proposed methodology is validated using a real four-contact RF-MEMS switch with complex geometry. The simulation results of the switch performance in the on-stage (closure) are in good agreement with experimental measurements demonstrating that the model is very effective in capturing the bouncing and contact deformation phenomena accurately. It is foreseen that the proposed approach will be instrumental in providing a better insight into the reliability of MEMS switches and will, ultimately, found a basis of developing and implementing control strategies to maximize their lifetime.
Keywords
damping; finite difference methods; mechanical contact; microswitches; nonlinear dynamical systems; reliability; Hertz theory; electrostatically actuated RF-MEMS switches; finite differential analysis; nonlinear dynamic model; nonlinear elastic-plastic contact mechanics; ohmic-contact RF-MEMS switch; squeeze-film damping effect; Contacts; Damping; Deformable models; Electrostatics; Force; Mathematical model; Microswitches;
fLanguage
English
Publisher
ieee
Conference_Titel
IECON 2010 - 36th Annual Conference on IEEE Industrial Electronics Society
Conference_Location
Glendale, AZ
ISSN
1553-572X
Print_ISBN
978-1-4244-5225-5
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2010.5675110
Filename
5675110
Link To Document