Title :
Non-Invasive Dual-Probe Time Domain Measurements of Incident and Reflected Waves on High-speed Digital Chip Interconnects
Author :
Barel, Alain ; Rolain, Yves ; Cumps, Ann
Author_Institution :
Dpt ELEC, Vrije Universiteit Brussel, Belgium
Abstract :
A dual high frequency probe method is proposed to acquire the incident and reflected waves on the transmission line between two high speed digital chips by use of a sampling scope.
Keywords :
Bandwidth; Circuit testing; Frequency; Integrated circuit interconnections; Performance evaluation; Probes; Reflection; Semiconductor device measurement; Time measurement; Transmission line measurements;
Conference_Titel :
ARFTG Conference Digest-Spring, 49th
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327229
