• DocumentCode
    1844216
  • Title

    Embedded Multiconductor Transmission Line Characterization

  • Author

    Williams, Dylan F.

  • Author_Institution
    National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
  • Volume
    31
  • fYear
    1997
  • fDate
    35582
  • Firstpage
    227
  • Lastpage
    230
  • Abstract
    This paper presents a measurement method that characterizes lossy printed multiconductor transmission lines embedded in transitions, connectors, or packages with significant electrical parasitics. we test the method on a pair of lossy coupled asymmetric microstrip lines and compare to previous results.
  • Keywords
    Connectors; Couplings; Electric variables measurement; Loss measurement; Microstrip; Multiconductor transmission lines; Packaging; Propagation losses; Testing; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 49th
  • Conference_Location
    Denver, CO, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1997.327233
  • Filename
    4119918
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1844216