DocumentCode :
1844308
Title :
Avoiding reverse recovery effects in super junction MOSFET based half-bridges
Author :
Conrad, Marcus ; DeDoncker, Rik W.
Author_Institution :
Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ., Aachen, Germany
fYear :
2015
fDate :
22-25 June 2015
Firstpage :
1
Lastpage :
5
Abstract :
For applications with a dc-link voltage in the range of 400 V and high switching frequencies, Super Junction MOSFETs are superior to standard MOSFETs due to their low on-state resistance. However, they suffer from an extensive reverse recovery effect of their intrinsic body diode. This limits their usage in hard-switching half-bridge configurations. This paper analyzes a modified half-bridge based on Super Junction MOSFETs, which offers significantly reduced reverse recovery losses while maintaining current conduction in reverse direction through the Super Junction MOSFET. Hence, the application of Super Junction MOSFETs in hard switched topologies becomes possible. Measurements of relevant voltage and current waveforms as well as the thermal distribution show the efficiency of the proposed method.
Keywords :
MOSFET; bridge circuits; junction gate field effect transistors; network topology; switching convertors; voltage measurement; current conduction; reverse recovery effect avoidance; super junction MOSFET based hard switching half bridge configuration; thermal distribution; voltage measurement; Capacitance; Current measurement; Inductance; MOSFET; Schottky diodes; Silicon carbide; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics for Distributed Generation Systems (PEDG), 2015 IEEE 6th International Symposium on
Conference_Location :
Aachen
Type :
conf
DOI :
10.1109/PEDG.2015.7223083
Filename :
7223083
Link To Document :
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