• DocumentCode
    1844359
  • Title

    A study of magnetic domain distribution in ferrite by magnetic force microscopy

  • Author

    Hsu, Wei-Sheng ; Yang, Min-Da ; Wang, Yi-Chen ; Lin, Li-Jiaun

  • Author_Institution
    Mater. & Chem. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
  • fYear
    2009
  • fDate
    18-21 Oct. 2009
  • Firstpage
    273
  • Lastpage
    277
  • Abstract
    In this study, vibration sample measurement (VSM) and magnetic force microscopy (MFM) have been used to observe the magnetic behavior and identify the magnetic domain distribution of NiZn ferrite, which was synthesized via chemical route and spray deposition method. Cases considered in the present study involve the types of NZF1 and NZF2 NiZn ferrite. VSM results show that the films with different deposition rate have the saturation magnetization from 200 to 900 emu/cm3, and the resistance of the film is about 1 Mohm. The ferromagnetic resonance frequency is 1 GHz approximately. MFM results show that images were also discussed the domain wall motion between the particle of NiZn ferrite, which generated the different magnetic moment direction. Therefore, MFM could obtain the relationship results between the qualitative magnetic domain structure distribution and surface morphology of two types of NiZn ferrite.
  • Keywords
    ferrites; ferromagnetic resonance; magnetic domains; magnetic force microscopy; magnetic moments; magnetic thin films; magnetisation; magnetometers; nickel compounds; zinc compounds; MFM; NiZnFe2O3; chemical route; ferrite; ferromagnetic resonance frequency; magnetic domain distribution; magnetic force microscopy; magnetic moment; saturation magnetization; spray deposition; vibration sample measurement; Magnetic analysis; Magnetic films; Magnetic resonance imaging; Perpendicular magnetic anisotropy; Magnetic Domain Distribution; Magnetic Force Microscopy; NiZn Ferrite;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Molecular Medicine and Engineering (NANOMED), 2009 IEEE International Conference on
  • Conference_Location
    Tainan
  • Print_ISBN
    978-1-4244-5528-7
  • Type

    conf

  • DOI
    10.1109/NANOMED.2009.5559070
  • Filename
    5559070