• DocumentCode
    1844377
  • Title

    Derivation of interconnect length distribution in X architecture LSIs

  • Author

    Nakashima, Hidenari ; Takagi, Naohiro ; Masu, Kazuya

  • Author_Institution
    Precision & Intelligence Lab., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2003
  • fDate
    2-4 June 2003
  • Firstpage
    60
  • Lastpage
    62
  • Abstract
    The prediction model for the interconnect length distribution (ILD) in LSIs with orthogonal interconnects based on Rent´s empirical rule is extended to the prediction of ILD for the X Architecture containing diagonal interconnects and all-directional interconnects. The effectiveness of the X Architecture is evaluated based on the new prediction model.
  • Keywords
    integrated circuit interconnections; large scale integration; prediction theory; LSI; Rent empirical rule; X architecture; interconnect length distribution; orthogonal interconnects; prediction model; Clocks; Electronic mail; Frequency; Integrated circuit interconnections; Laboratories; Large scale integration; Logic circuits; Pins; Predictive models; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International
  • Print_ISBN
    0-7803-7797-4
  • Type

    conf

  • DOI
    10.1109/IITC.2003.1219713
  • Filename
    1219713
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1844377