• DocumentCode
    1844451
  • Title

    3-D thermal simulation with dynamic power profiles

  • Author

    Choi, Eunjoo ; Shin, Youngsoo

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2765
  • Lastpage
    2768
  • Abstract
    On-chip temperature and temperature gradient have been emerging as important design criteria as technology is scaled down to nano-meter regime. There have been several approaches to analyze or simulate the thermal behavior of chips, but all the approaches assume constant average power consumption of each block, which is reasonable when the change in power is localized and transient. However, as the aggressive power management techniques are employed in block level of granularity, power consumption of blocks become fluctuating a lot, which yields a large error with the conventional thermal analysis. A 3-D thermal simulation, with time-varying power consumption of blocks, is proposed in this paper. The partial differential heat conduction equation is solved with finite difference method, and we also employ alternating direction implicit method to decrease the computational complexity. The prototype simulator was designed and tested on several examples.
  • Keywords
    computational complexity; finite difference methods; nanoelectronics; partial differential equations; power integrated circuits; 3D thermal simulation; computational complexity; constant average power consumption; dynamic power profiles; finite difference method; nanometer regime; onchip temperature; partial differential heat conduction equation; power management techniques; thermal analysis; time-varying power consumption; Analytical models; Computational modeling; Difference equations; Differential equations; Energy consumption; Energy management; Partial differential equations; Temperature; Thermal management; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542030
  • Filename
    4542030