DocumentCode
1844451
Title
3-D thermal simulation with dynamic power profiles
Author
Choi, Eunjoo ; Shin, Youngsoo
Author_Institution
Dept. of Electr. Eng., KAIST, Daejeon
fYear
2008
fDate
18-21 May 2008
Firstpage
2765
Lastpage
2768
Abstract
On-chip temperature and temperature gradient have been emerging as important design criteria as technology is scaled down to nano-meter regime. There have been several approaches to analyze or simulate the thermal behavior of chips, but all the approaches assume constant average power consumption of each block, which is reasonable when the change in power is localized and transient. However, as the aggressive power management techniques are employed in block level of granularity, power consumption of blocks become fluctuating a lot, which yields a large error with the conventional thermal analysis. A 3-D thermal simulation, with time-varying power consumption of blocks, is proposed in this paper. The partial differential heat conduction equation is solved with finite difference method, and we also employ alternating direction implicit method to decrease the computational complexity. The prototype simulator was designed and tested on several examples.
Keywords
computational complexity; finite difference methods; nanoelectronics; partial differential equations; power integrated circuits; 3D thermal simulation; computational complexity; constant average power consumption; dynamic power profiles; finite difference method; nanometer regime; onchip temperature; partial differential heat conduction equation; power management techniques; thermal analysis; time-varying power consumption; Analytical models; Computational modeling; Difference equations; Differential equations; Energy consumption; Energy management; Partial differential equations; Temperature; Thermal management; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4542030
Filename
4542030
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