• DocumentCode
    1844508
  • Title

    Binning algorithm for accurate computer aided device modeling

  • Author

    Mendhurwar, Kaustubha A. ; Devabhaktuni, Vijay K. ; Raut, Rabin

  • Author_Institution
    Dept. of ECE, Concordia Univ., Montreal, QC
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2773
  • Lastpage
    2776
  • Abstract
    Accurate modeling of devices is critical to efficient computer aided design and optimization. Commonly encountered modeling techniques include empirical formulae, equivalent circuits, and black-box models (eg. neural networks). Important criteria in device modeling are model accuracy, computational simplicity, generality of the modeling approach, and so forth. In this paper, we present a new and systematic CAD algorithm to device modeling based on a concept often referred to as binning. For a given set of data either from measurements or simulations, the proposed algorithm leads to an accurate model comprising of a set of sub-models with best possible accuracy, while keeping the model structure simple. The proposed algorithm is general and can be applied in the context of any black-box modeling technique. In this paper, the algorithm is illustrated for the case of neural network modeling. Resulting models are shown to exhibit relatively better accuracies compared to those developed using a standard modeling approach. Both active and passive modeling examples are presented.
  • Keywords
    circuit CAD; neural nets; binning algorithm; black-box modeling; computer aided device modeling; equivalent circuits; neural network modeling; systematic CAD algorithm; Algorithm design and analysis; Computational modeling; Context modeling; Design automation; Design optimization; Equivalent circuits; Neural networks; Standards development; Table lookup; Training data; Computer-aided design; Device modeling; Neural networks; Optimization; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542032
  • Filename
    4542032