DocumentCode
1844560
Title
Performance comparison between copper, carbon nanotube, and optical interconnects
Author
Saraswat, Krishna ; Cho, Hoyeol ; Kapur, Pawan ; Koo, Kyung-Hoae
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA
fYear
2008
fDate
18-21 May 2008
Firstpage
2781
Lastpage
2784
Abstract
The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs.
Keywords
carbon nanotubes; integrated circuit interconnections; integrated optoelectronics; optical interconnections; C; Cu; carbon nanotube; high-performance IC; off-chip interconnects; optical interconnects; Bandwidth; Carbon nanotubes; Conductivity; Copper; Delay; Inductance; Integrated circuit interconnections; Optical interconnections; Optical scattering; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4542034
Filename
4542034
Link To Document