DocumentCode :
1844560
Title :
Performance comparison between copper, carbon nanotube, and optical interconnects
Author :
Saraswat, Krishna ; Cho, Hoyeol ; Kapur, Pawan ; Koo, Kyung-Hoae
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
2781
Lastpage :
2784
Abstract :
The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs.
Keywords :
carbon nanotubes; integrated circuit interconnections; integrated optoelectronics; optical interconnections; C; Cu; carbon nanotube; high-performance IC; off-chip interconnects; optical interconnects; Bandwidth; Carbon nanotubes; Conductivity; Copper; Delay; Inductance; Integrated circuit interconnections; Optical interconnections; Optical scattering; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4542034
Filename :
4542034
Link To Document :
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