• DocumentCode
    1844560
  • Title

    Performance comparison between copper, carbon nanotube, and optical interconnects

  • Author

    Saraswat, Krishna ; Cho, Hoyeol ; Kapur, Pawan ; Koo, Kyung-Hoae

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2781
  • Lastpage
    2784
  • Abstract
    The interconnect bottleneck presents a compelling reason to explore novel interconnect architectures. In this work, we have quantified and compared the performance of two promising interconnects: carbon nanotube (CNT) and optical interconnects with the scaled Cu/low-k on-chip and off-chip interconnects for future high-performance ICs.
  • Keywords
    carbon nanotubes; integrated circuit interconnections; integrated optoelectronics; optical interconnections; C; Cu; carbon nanotube; high-performance IC; off-chip interconnects; optical interconnects; Bandwidth; Carbon nanotubes; Conductivity; Copper; Delay; Inductance; Integrated circuit interconnections; Optical interconnections; Optical scattering; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542034
  • Filename
    4542034