Title :
A History of Microwave Wafer Probing
Author_Institution :
Cascade Microtech, Inc., eric@cmicro.com
Abstract :
A series of slides and pictures display the technological history of microwave wafer probing.
Keywords :
Biomembranes; Chip scale packaging; Digital integrated circuits; History; Integrated circuit layout; Integrated circuit testing; Microelectronics; Plastic integrated circuit packaging; Probes; Production;
Conference_Titel :
ARFTG Conference Digest-Fall, 50th
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1997.327248
