• DocumentCode
    1844642
  • Title

    Large-signal circuit-based time domain analysis of high frequency devices including distributed effects

  • Author

    Waliullah, M. ; El-Ghazaly, S.M. ; Goodnick, S.

  • Author_Institution
    Telecommun. Res. Center, Arizona State Univ., Tempe, AZ, USA
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    2145
  • Abstract
    A fully distributed equivalent circuit model for MESFET is presented in this paper. The distributed circuit model incorporates sufficient number of segments to account for accurately wave propagation effects along device width. For the first time, distributed model having several segments is analyzed in time domain, which has the capability to evaluate large signal behavior. For a given MESFET, passive equivalent circuit elements are extracted from full wave simulation of the passive part as coplanar-coupled transmission lines using finite difference time domain technique. Active equivalent circuit elements are obtained from full hydrodynamic simulation with Curtice large signal model. The two equivalent circuits are combined together to form the basic unit segment. Several high frequency and high power characteristics of transistors are investigated and compared with previously published results.
  • Keywords
    Schottky gate field effect transistors; equivalent circuits; finite difference time-domain analysis; semiconductor device models; Curtice large-signal model; MESFET; coplanar coupled transmission lines; distributed equivalent circuit model; finite difference time domain analysis; full-wave simulation; high-frequency device; high-power characteristics; hydrodynamic simulation; wave propagation; Circuit simulation; Coplanar transmission lines; Distributed parameter circuits; Equivalent circuits; Finite difference methods; Frequency; MESFET circuits; Power transmission lines; Signal analysis; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012295
  • Filename
    1012295