• DocumentCode
    1844651
  • Title

    High efficiency architecture of escot with pass concurrent context modeling scheme for scalable video coding

  • Author

    Chiang, Jen-Shiun ; Hwang, Ting-Hao ; Lin, Tsung-Ta ; Hsia, Chih-Hsien

  • Author_Institution
    Dept. of Electr. Eng., Tamkang Univ., Taipei
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    2801
  • Lastpage
    2804
  • Abstract
    In this work, we propose a high efficiency hardware architecture of embedded sub-band coding with optimal truncation (ESCOT) with pass concurrent context modeling (PCCM) scheme for wavelet-based scalable video coding (SVC). PCCM can merge the three-pass process of bit-plane coding into a single pass process. It improves the efficiency of the ESCOT algorithm and reduces the frequencies of memory access, which can reduce the power consumption. Furthermore we use the parallel architecture scheme of PCCM to encode 4 samples concurrently, which improves the operation speed and can reduce 40% of internal memory requirement. We use Artison TSMC 0.18 mum 1P6M standard cell library to design and implement the proposed concurrent context modeling. The simulation results indicate that PCCM can have an operation speedup of 9.5 compared to the standard context modeling of ESCOT, and it can operate for 1080 p with frame rate of 30 fps at clock rate of 125 MHz.
  • Keywords
    embedded systems; parallel architectures; video coding; wavelet transforms; Artison TSMC; ESCOT algorithm; bit-plane coding; embedded sub-band coding; hardware architecture; internal memory requirement; memory access; optimal truncation; parallel architecture scheme; pass concurrent context modeling scheme; power consumption; wavelet-based scalable video coding; Context modeling; Discrete wavelet transforms; Encoding; Entropy coding; Hardware; Static VAr compensators; Video coding; Video compression; Video sequences; Wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4542039
  • Filename
    4542039