• DocumentCode
    1844656
  • Title

    The "Smoothie" data base model for the correct modeling of non-linear distortion in FET devices

  • Author

    Cuoco, V. ; van den Heijden, M.P. ; de Vreede, L.C.N.

  • Author_Institution
    Lab. of Electron. Components Technol. & Mater., Delft Univ. of Technol., Netherlands
  • Volume
    3
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    2149
  • Abstract
    Currently available data base model implementations fail to correctly model intermodulation products at small to medium signal power levels. In this paper we present the "Smoothie" data base model for FET devices. The model is implemented within Agilent\´s Advanced Design System (ADS) and is based on the smoothing splines approximation of the device Y-parameters. All four the main functions (i.e. the port currents and charges) are found by analytical integration of the Y-parameters smoothing spline approximations. The use of the smoothing splines approximation compared to the conventional spline interpolation reduces the influence of measurement noise and yields to well behaved continuous higher order derivatives, which are essential in the simulation of circuit linearity. By choosing a proper set of splines control parameters, the user can influence the tradeoff between closeness and smoothness of the approximation. In this work we give an overview of the capabilities of "Smoothie" and compare it to the HP Root data base model.
  • Keywords
    field effect transistors; intermodulation distortion; nonlinear distortion; semiconductor device models; splines (mathematics); Advanced Design System; FET device; Smoothie data base model; Y-parameters; intermodulation product; nonlinear distortion; smoothing splines approximation; Circuit noise; Circuit simulation; FETs; Integrated circuit measurements; Interpolation; Linearity; Noise measurement; Noise reduction; Power system modeling; Smoothing methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1012296
  • Filename
    1012296