• DocumentCode
    1844940
  • Title

    Series-Resistor Calibration

  • Author

    Williams, Dylan F. ; Walker, David K.

  • Author_Institution
    National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
  • Volume
    32
  • fYear
    1997
  • fDate
    Dec. 1997
  • Firstpage
    131
  • Lastpage
    137
  • Abstract
    We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method.
  • Keywords
    Calibration; Circuits; Coplanar waveguides; Impedance; Measurement standards; NIST; Reflection; Resistors; Standards publication; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 50th
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1997.327267
  • Filename
    4119950
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1844940