DocumentCode
1845000
Title
Correction of energy-dependent systematic errors in dual-energy X-ray CT using a basis material coefficients transformation method
Author
Goh, K.L. ; Liew, S.C. ; Hasegawa, B.H.
Author_Institution
Nat. Univ. of Singapore, Singapore
Volume
2
fYear
1996
fDate
2-9 Nov 1996
Firstpage
1453
Abstract
Computer simulation results from our previous studies showed that energy dependent systematic errors exist in the values of attenuation coefficient synthesized using the basis material decomposition technique with acrylic and aluminum as the basis materials, especially when a high atomic number element (e.g., iodine from radiographic contrast media) was present in the body. The errors were reduced when a basis set was chosen from materials mimicking those found in the phantom. In the present study, we employed a basis material coefficients transformation method to correct for the energy-dependent systematic errors. In this method, the basis material coefficients were first reconstructed using the conventional basis materials (acrylic and aluminum) as the calibration basis set. The coefficients were then numerically transformed to those for a more desirable set of basis materials. The transformation was done at the effective energies of the low and high energy windows of the X-ray spectrum. With this correction method using acrylic and an iodine-water mixture as our desired basis set, computer simulation results showed that an accuracy of better than 2% could be achieved even when iodine was present in the body at a concentration as high as 10% by mass
Keywords
aluminium; calibration; computerised tomography; iodine; liquid mixtures; measurement errors; water; Al; I-H2O; I-water mixture; X-ray spectrum; acrylic; basis material coefficients transformation method; calibration basis set; coefficients; computer simulation; dual-energy X-ray CT; energy-dependent systematic errors; phantom; Aluminum; Attenuation; Biological materials; Calibration; Computed tomography; Computer errors; Computer simulation; Error correction; Imaging phantoms; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
0-7803-3534-1
Type
conf
DOI
10.1109/NSSMIC.1996.591722
Filename
591722
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