DocumentCode
1845127
Title
X-band microstrip bandpass filter using photoimageable thick-film materials
Author
Ng, C.Y. ; Chongcheawchamnan, M. ; Aftanasar, M.S. ; Robertson, I.D. ; Minalgiene, J.
Author_Institution
Sch. of Electron., Comput. & Math., Surrey Univ., Guildford, UK
Volume
3
fYear
2002
fDate
2-7 June 2002
Firstpage
2209
Abstract
The rapid growth in commercial microwave technology, particularly for wireless communication, has created a demand for low-cost, high quality microwave fabrication technologies that are also suitable for high volume production. Modern thick-film materials are well placed to meet these requirements, in that they offer low conductor and dielectric losses, with good surface finishes and the ability to realise fine conductor geometries. This paper studies the feasibility of realizing microwave bandpass filters using thick-film photoimaging techniques. This enhanced thick-film technology can realise very narrow line width and spacing, giving performance comparable to the more expensive thin-film techniques. This is an inexpensive and mature technology, which looks set to revolutionize the manufacturing of microwave and MM-wave circuits in the near future. The fabricated filter achieved an insertion loss of only 0.7 dB over the frequency range of 9-11 GHz.
Keywords
band-pass filters; integrated circuit technology; microstrip filters; microwave filters; multichip modules; passive filters; thick film circuits; 0.7 dB; 9 to 11 GHz; MCM-C; X-band microstrip bandpass filter; ceramic-based MCM technology; enhanced thick-film technology; high volume production; microwave bandpass filters; microwave fabrication technologies; photoimageable thick-film materials; thick-film photoimaging techniques; Band pass filters; Conducting materials; Dielectric losses; Dielectric materials; Fabrication; Microstrip filters; Microwave technology; Production; Surface finishing; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location
Seattle, WA, USA
ISSN
0149-645X
Print_ISBN
0-7803-7239-5
Type
conf
DOI
10.1109/MWSYM.2002.1012311
Filename
1012311
Link To Document