DocumentCode :
1845145
Title :
Statistical image modeling using von Mises distribution in the complex directional wavelet domain
Author :
Vo, An P N ; Oraintara, Soontorn ; Nguyen, Truong T.
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
2885
Lastpage :
2888
Abstract :
In this paper, a new statistical model is proposed for modeling the nature images in the transform domain. We demonstrate that the von Mises distribution (VM) fits accurately the behaviors of relative phases in the complex directional wavelet subband from different nature images. Moreover, a new image feature based on the VM model is proposed for texture image retrieval application. The VM based feature yields higher retrieval accuracy compared to the energy features and the relative phase features. In addition to magnitude information typically used in many other feature extraction methods, the VM based phase information is also incorporated to further improve the performance.
Keywords :
image processing; statistics; wavelet transforms; directional wavelet domain; nature images; statistical image modeling; von Mises distribution; Feature extraction; Geophysics; Hidden Markov models; Image processing; Image retrieval; Statistical distributions; Virtual manufacturing; Wavelet coefficients; Wavelet domain; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4542060
Filename :
4542060
Link To Document :
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